Meetings

Session A

• A10. Advances in Scanned Probe Microscopy 1: Novel Approaches and Ultrasensitive Detection
  • A10.00002: Graphene-based Hall probe magnetic imaging
    David Collomb, Penglei Li, Simon Bending

Session D

• D10. Scattering and Diffraction
  
  • D10.00006: Interferometric tracking of nanoparticle orientation with quantitative optical anisotropy imaging
    Zhixing He, Chengshuai Li, Yizheng Zhu, Hans Robinson
  • D10.00009: Laboratory Based Hard X-ray Photoelectron Spectroscopy
    Susanna Eriksson, Brandon Giles
  • D10.00010: Probing bulk electronic structure with a laboratory-based hard x-ray angle-resolved photoemission spectrometer
    Joseph Grassi, Arian Arab, Jay Paudel, Raj Sah, Weibing Yang, Ravini Chandrasena, Keisuke Kobayashi, Alexander Gray
  • D10.00011: Development of in-situ differential thermal analysis for crystal growth experiments
    Yuri Janssen, Jose Nicasio, Kemar Dudley, Bingying Xia, Jack Simonson
  • D10.00012: Early stage of iron anodic oxidation measured by 25ms-resolution X-ray reflectometry
    Hiromasa Fujii, Takashi Doi, Yusuke Wakabayashi

Session G

• G10. Detectors, Sensors, and Transducers
  • G10.00001: Semiconductor Particle Detector based on Work Function Modulation
    Elaine Rhoades, William Hunt, Aaron Green
  • G10.00002: Characterizaion of Micro-Magnets on Mechanical Oscillators, and Other Sensors Using Fiber-Optic Interferometry*
    Peter Kampschroeder, Sierra Casten, Nimisha Ramprasad, Allen Wen, Scott Williams, John Markert

Session J

• J10. Advances in Scanned Probe Microscopy 4: Machine Learning for Correlative and Analytical Measurements in Scanning Probe Microscopy
  • J10.00002: Nonlinearity-induced frequency mixing in AFM: novel contrast imaging with machine learning
    Greg Haugstad, Andrew Avery, Stephan Hubig, Rachel Rahn, Alon McCormick, Bing Luo, Han Seung Lee
  • J10.00003: Light Scattering and Localization by Dislocation Scattering Sites
    Farbod Shafiei, Tommaso Orzali, Alexey Vert, Mohammad-Ali Miri, PY Hung, Man Hoi Wong, Andrea Alu, Gennadi Bersuker, Michael Downer
• J27. Experimental optical spectroscopic measurements of 2D materials
  • J27.00007: Giant second harmonic generation from polar van der Waals Bismuth tellurohalide semiconductors
    Prashant Padmanabhan, Samuel Gilinsky, Kevin Kwock, Nicholas Sirica, Jaewook Kim, Sang-Wook Cheong, Rohit Prasankumar

Session L

• L10. Fundamental Measurement Science
  • L10.00007: Digitizer nonlinearity correction with an AC Josephson Voltage Standard
    Jason Underwood, Bryan Waltrip
• L37. Nanoscale Characterization of Correlated and Entangled Quantum Phenomena
  • L37.00004: Interrogating Entangled Matter with Entangled Probes
    Patrick Blackstone, Abu Ashik Md. Irfan, Gerardo Ortiz

Session M

• M27. Optical Spectroscopic Measurements of 2D Materials
  • M27.00004: Strong-Coupling of Hybrid Quasiparticles in Excitonic-Dielectric Gratings
    Bhaskar Abhiraman, Huiqin Zhang, Qing Zhang, Jinshui Miao, Kiyoung Jo, Stefano Roccasecca, Mark Knight, Artur Davoyan, Deep Jariwala

Session C

• C34. Keithley Session
  • C34.00002: Resonant Inelastic X-ray Scattering of Energy Materials: from Fundamental Understandings to Practical Developments
    Wanti Yang

Session C

• C05. Patents, Innovations, and Wars!
  • C05.00003: Patent Sense: knowing when to pursue patent protection
    Dan Krueger

Session V

• V32. Joseph F. Keithly and Industrial Physics Awards
  • V32.00004: Distinguished Lectureship on the Applications of Physics Talk: mK to km: How Millikelvin Physics is Reused to Explore the Earth Kilometers Below the Surface
    Robert Kleinberg

Session H

• H36. Advances in Scanned Probe Microscopy II
  • H36.00001: Revealing Energy Level Structure of Individual Quantum Dots by Single-Electron Sensitive Electrostatic Force Spectroscopy
    Peter Grutter

Session K

• K21. Keithley Award Session
  • K21.00002: You can't measure what you can't see -- detectors for microscopies
    Peter Denes

Session S

• S12. Prospects and Challenges in Medical Physics and Imaging
  • S12.00005: NIH Funding for Biomedical Imaging
    Richard Conroy

Session M

• M21. Focus Session: Novel Instrumentation and Measurement Science for X-ray and Neutrons
  • M21.00001: Measurement and Instrumentation Challenges at X-ray Free Electron Lasers
    Yiping Feng

Session T

• T18. Invited Sessions: Keithley Award Symposium
  • T18.00001: Spin-Polarized Electron Probes of Nanomagnetism
    John Unguris

Session A

• A38. Focus Session: instrumentation and Measurement Science for a Sustainable Energy Future
  • A38.00001: Our Sustainable Earth
    Raymond L. Orbach

Session U

• U46. Focus Session: Advances in Scanned Probe Microscopy 2: High Frequencies and Optical Techniques
  • U46.00001: Edge mode imaging in magnetic nanodisks using ferromagnetic resonance force microscopy
    Feng Guo

Session Z

• Z1. Invited Session: Time- and Angle- Resolved Photoemission Spectroscopy of Complex Materials
  • Z1.00003: Measurement of intrinsic Dirac fermion cooling of a topological insulator with time- and angle- resolved photoemission spectroscopy
    Yihua Wang

Session P

• P19. Invited Session: Dynamics of Strongly Correlated Systems: Control and Ultrafast X-ray Probes
  • P19.00005: High frequency properties of individual metallic carbon nanotubes
    Daniel Santavicca

Session Q

• Q33. Focus Session: X-ray and Neutron Instruments and Measurement Science
  
  • Q33.00005: Facility Overview and Double-Focusing Thermal Triple-Axis Spectrometer at the NCNR
    Jeffrey Lynn

Session T

• T46. Invited Session: Keithley Award Session: Photoacoustic and Photothermal Measurement Science
  • T46.00005: Understanding climate: the role of photoacoustic spectroscopy at NIST
    Keith Gillis

Session W

• W2. Invited Session: Instrumentation and Measurement Science for Energy Research: PV and Batteries
  • W2.00001: Using Deep Level Transient Spectroscopy (DLTS) to characterize defects in semiconductor devices
    David Lang